Reliability of Semiconductor Lasers and Optoelectronic Devices

Reliability of Semiconductor Lasers and Optoelectronic Devices

Herrick, Robert; Ueda, Osamu

Elsevier Science Publishing Co Inc

03/2021

334

Mole

Inglês

9780128192542

15 a 20 dias

550

Descrição não disponível.
1. Introduction to optoelectronic devices
Robert W. Herrick and Qiang Guo
2. Reliability engineering in optoelectronic devices and fiber optic transceivers
Robert W. Herrick
3. Case studies in fiber optic reliability
Robert W. Herrick
4. Materials science of defects in GaAs-based semiconductor lasers
Kunal Mukherjee
5. Grown-in defects and thermal instability affecting the reliability of lasers: III-Vs versus III nitrides
Osamu Ueda and Shigetaka Tomiya
6. Reliability of lasers on silicon substrates for silicon photonics
Justin C. Norman, Daehwan Jung, Alan Y. Liu, Jennifer Selvidge, Kunal Mukherjee, John E. Bowers and Robert W. Herrick
7. Degradation mechanisms of InGaN visible LEDs and AlGaN UV LEDs
C. De Santi, A. Caria, F. Piva, G. Meneghesso, E. Zanoni and M. Meneghini
?Accelerated aging; Burgers vector; Case studies; Composition-modulated structure; Dark defects; Defects in LEDs; Degradation; Dislocation; Dislocation loop; Early failures; Fiber optic transceivers; Field failure; GR-468; GaN LEDs; Grown-in defects; Heteroepitaxial integration; Heteroepitaxy; Heterogeneous integration; Inclusion; Laser burn-in; Laser burn-in optimization; Laser degradation; Microtwin; Misfit dislocation; Optoelectronic reliability; Ordered structure; Point defect diffusion; Precipitate; Quantum dot lasers; Reliability data collection; Reliability engineering; Reliability monitoring; Reliability of blue LEDs; Reliability of fiber optic transceivers; Reliability of ultraviolet LEDs; Reliability qualification; Semiconductor laser reliability; Silicon photonics; Stacking fault