Atomic Force Microscopy

Introduction.- Part I: Scanning Probe Microscopy Instrumentation.- Harmonic Oscillator.- Technical Aspects of Scanning Probe Microscopy.- Scanning Probe Microscopy Designs.- Electronics for Scanning Probe Microscopy.- Lock-In Technique.- Data Representation and Image Processing.- Artifacts in SPM.- Work Function, Contact Potential, and Kelvin Probe.- Part II: Atomic Force Microscopy (AFM).- Forces between Tip and Sample.- Technical Aspects of Atomic Force Microscopy.- Static Atomic Force Microscopy.- Amplitude Modulation (AM) Mode in Dynamic Atomic Force Microscopy.- Intermittent Contact Mode/Tapping Mode.- Mapping of Mechanical Properties Using Force-Distance.- Frequency Modulation (FM) Mode in Dynamic Atomic Force.- Noise in Atomic Force Microscopy.- Quartz Sensors in Atomic Force Microscopy.

Este título pertence ao(s) assunto(s) indicados(s). Para ver outros títulos clique no assunto desejado.

• Análise de espectro, spectrochemistry, espectrometria de massa
• Microscopia
• Nanotecnologia
• Fabrico de instrumentos de precisão

Scanning Probe Microscopy;Lock-In Technique;Artifacts in SPM;Kelvin Probe Microscopy;Static Atomic Force Microscopy;Dynamic Atomic Force Microscopy;Biological Microscopy