Advanced Optical Spectroscopy Techniques for Semiconductors
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Advanced Optical Spectroscopy Techniques for Semiconductors
Raman, Infrared, and Cathodoluminescence Spectroscopy
Yoshikawa, Masanobu
Springer International Publishing AG
03/2024
223
Mole
9783031197246
15 a 20 dias
Descrição não disponível.
1. Introduction.- 2. Raman and infrared (IR) spectroscopy.- 3. Photoluminescence (PL) spectroscopy.- 4. Overview of cathodoluminescence (CL) spectroscopy.- 5. Applications of Raman, IR, and CL spectroscopy.- 6. STEM-CL spectroscopy.- 7. Topics.- Index.
Este título pertence ao(s) assunto(s) indicados(s). Para ver outros títulos clique no assunto desejado.
Scanning Electron Transmission Microscopy;Vibrational Spectroscopy;Gallium Arsenide Devices;Strained Silicon;Indium Phosphate Devices;Terahertz Time-Domain Spectroscopy;Crystal Orientation Characterization;Stress Determination Using Raman Spectroscopy;Michelson Interferometer;Scanning Near-Field Optical Microscopy;Characterization of Semiconductors;Spectroscopy of Semiconductors;Nano-Diamond Thin Films
1. Introduction.- 2. Raman and infrared (IR) spectroscopy.- 3. Photoluminescence (PL) spectroscopy.- 4. Overview of cathodoluminescence (CL) spectroscopy.- 5. Applications of Raman, IR, and CL spectroscopy.- 6. STEM-CL spectroscopy.- 7. Topics.- Index.
Este título pertence ao(s) assunto(s) indicados(s). Para ver outros títulos clique no assunto desejado.
Scanning Electron Transmission Microscopy;Vibrational Spectroscopy;Gallium Arsenide Devices;Strained Silicon;Indium Phosphate Devices;Terahertz Time-Domain Spectroscopy;Crystal Orientation Characterization;Stress Determination Using Raman Spectroscopy;Michelson Interferometer;Scanning Near-Field Optical Microscopy;Characterization of Semiconductors;Spectroscopy of Semiconductors;Nano-Diamond Thin Films
