Advances in Imaging and Electron Physics

Preface Martin Hytch and Peter W. Hawkes 1. Measuring elastic strains and orientation gradients by scanning electron microscopy: Conventional and emerging methods Clement Ernould, Benoit Beausir, Jean-Jacques Fundenberger, Vincent Taupin and Emmanuel Bouzy 2. Development of a global homography-based approach for high-angular resolution in the SEM Clement Ernould, Benoit Beausir, Jean-Jacques Fundenberger, Vincent Taupin and Emmanuel Bouzy 3. Implementing the homography-based global approach Clement Ernould, Benoit Beausir, Jean-Jacques Fundenberger, Vincent Taupin and Emmanuel Bouzy 4. Numerical validation and influence of optical distorsions on accuracy Clement Ernould, Benoit Beausir, Jean-Jacques Fundenberger, Vincent Taupin and Emmanuel Bouzy 5. Applications of the method Clement Ernould, Benoit Beausir, Jean-Jacques Fundenberger,Vincent Taupin and Emmanuel Bouzy 6. Spin wave physics: The nonlinear spin wave-electromagnetic interaction and implications for high frequency devices Clifford M. Krowne

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• Processamento de sinais
• Dispositivos e materiais electrónicos
• Engenharia mecânica

Accuracy; EBSD; Elastic strains; Ferrite magnetic materials; GND; Grain internal disorientation; High-angular resolution; Homography; HR-EBSD; HR-TKD; IC-GN; Indexing; Limiters; Limiting electromagnetic (EM) signals from antennas; Magnetodynamic equations of motion; Nanostructure; Nonlinear interaction; Optical distortion; Orientation imaging microscopy; Scanning electron microscopy; Spin waves; TKD