Advances in Optics of Charged Particle Analyzers: Part 1

Advances in Optics of Charged Particle Analyzers: Part 1

Hytch, Martin; Hawkes, Peter W.

Elsevier Science Publishing Co Inc

10/2024

232

Dura

9780443297861

Pré-lançamento - envio 15 a 20 dias após a sua edição

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Preface
1. Charged Particles in Electromagnetic Fields
Mikhail Yavor
2. Language of Aberration Expansions in Charged Particle Optics
Mikhail Yavor
3. Transporting Charged Particle Beams in Static Fields
Mikhail Yavor
4. Transporting Charged Particles in Radiofrequency Fields
Mikhail Yavor
5. Transporting and Separating Ions in Gas-Filled Channels
Mikhail Yavor
6. Static Magnetic Charged Particle Analyzers
Mikhail Yavor
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Charged Particles in Electromagnetic Fields; Language of Aberration Expansions in Charged Particle Optics; Transporting Charged Particle Beams in Static Fields; Transporting Charged Particles in Radiofrequency Fields; Transporting and Separating Ions in Gas-Filled Channels; Static Magnetic Charged Particle Analyzers; Electrostatic Energy Analyzers; Mass Analyzers With Combined Electrostatic and Magnetic Fields; Mass Analyzers based on Fourier Transform; Principles of Time-of-Flight Mass Analyzers; Multi-Pass Time-of-Flight Mass Analyzers; Radiofrequency Mass Analyzers