Electromigration in Metals
Electromigration in Metals
Fundamentals to Nano-Interconnects
Ho, Paul S.; Sukharev, Valeriy; Hu, Chao-Kun; Gall, Martin
Cambridge University Press
05/2022
430
Dura
Inglês
9781107032385
15 a 20 dias
980
Electromigration in Metals
Fundamentals to Nano-Interconnects
Ho, Paul S.; Sukharev, Valeriy; Hu, Chao-Kun; Gall, Martin
Cambridge University Press
05/2022
430
Dura
Inglês
9781107032385
15 a 20 dias
980