Theory and Practice of Thermal Transient Testing of Electronic Components
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Theory and Practice of Thermal Transient Testing of Electronic Components
Poppe, Andras; Farkas, Gabor; Rencz, Marta
Springer Nature Switzerland AG
01/2024
385
Mole
Inglês
9783030861766
15 a 20 dias
Descrição não disponível.
Introduction: the Importance and Motivation.- Theoretical Background: History, the Network Identification by Deconvolution (NID) Method, Structure Functions, the Thermal Signature.- The Use of Thermal Transient Testing.- General Practical Questions and the Flow of Thermal Transient Measurements.- On the Accuracy and Repeatability of Thermal Measurements.
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Bipolar transistors;Capacitors;IGBT devices;LEDs;MOS transistors;Reliability testing;Resistors;Si diodes;Structure integrity testing;Thermal characterization;Thermal testing;Thermal transient testing;Wide bandgap materials
Introduction: the Importance and Motivation.- Theoretical Background: History, the Network Identification by Deconvolution (NID) Method, Structure Functions, the Thermal Signature.- The Use of Thermal Transient Testing.- General Practical Questions and the Flow of Thermal Transient Measurements.- On the Accuracy and Repeatability of Thermal Measurements.
Este título pertence ao(s) assunto(s) indicados(s). Para ver outros títulos clique no assunto desejado.
