Statistical Modeling and Robust Inference for One-shot Devices
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Statistical Modeling and Robust Inference for One-shot Devices
Balakrishnan, Narayanaswamy; Castilla, Elena
Elsevier Science Publishing Co Inc
04/2025
250
Mole
Inglês
9780443141539
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1. Introduction
2. Inference for One-Shot Devices with a Single Failure mode
3. Divergence Measures and their Application to One-Shot Devices with a Single Failure mode
4. Robust Inference under the Exponential Distribution
5. Robust Inference under the Gamma Distribution
6. Robust Inference under the Weibull Distribution
7. Robust Inference under the Lognormal distribution
8. Robust Inference under the Proportional Hazards Model
9. Inference for One-Shot Devices with Multiple Failure Modes
10. Robust Inference under the Exponential Distribution and Competing Risks
11. Robust Inference under the Weibull Distribution and Competing Risks
12. Robust Inference under Cyclic Accelerated Life Tests
13. Summary and Future Directions
Appendix A Derivation of the Influence Function of the Weighted Minimum DPD Estimators
2. Inference for One-Shot Devices with a Single Failure mode
3. Divergence Measures and their Application to One-Shot Devices with a Single Failure mode
4. Robust Inference under the Exponential Distribution
5. Robust Inference under the Gamma Distribution
6. Robust Inference under the Weibull Distribution
7. Robust Inference under the Lognormal distribution
8. Robust Inference under the Proportional Hazards Model
9. Inference for One-Shot Devices with Multiple Failure Modes
10. Robust Inference under the Exponential Distribution and Competing Risks
11. Robust Inference under the Weibull Distribution and Competing Risks
12. Robust Inference under Cyclic Accelerated Life Tests
13. Summary and Future Directions
Appendix A Derivation of the Influence Function of the Weighted Minimum DPD Estimators
Este título pertence ao(s) assunto(s) indicados(s). Para ver outros títulos clique no assunto desejado.
Accelerated life tests; Bayesian inference; Competing risks; Confidence intervals; Exponential distribution; Influence function; Likelihood inference; Lognormal distribution; Minimum DPD estimators; Model misspecification; Non-parametric inference; One-shot devices; Proportional hazards; Reliability; Robustness; Semi-parametric model; Survival analysis; Wald test; Wald-type tests; Weibull distribution;
1. Introduction
2. Inference for One-Shot Devices with a Single Failure mode
3. Divergence Measures and their Application to One-Shot Devices with a Single Failure mode
4. Robust Inference under the Exponential Distribution
5. Robust Inference under the Gamma Distribution
6. Robust Inference under the Weibull Distribution
7. Robust Inference under the Lognormal distribution
8. Robust Inference under the Proportional Hazards Model
9. Inference for One-Shot Devices with Multiple Failure Modes
10. Robust Inference under the Exponential Distribution and Competing Risks
11. Robust Inference under the Weibull Distribution and Competing Risks
12. Robust Inference under Cyclic Accelerated Life Tests
13. Summary and Future Directions
Appendix A Derivation of the Influence Function of the Weighted Minimum DPD Estimators
2. Inference for One-Shot Devices with a Single Failure mode
3. Divergence Measures and their Application to One-Shot Devices with a Single Failure mode
4. Robust Inference under the Exponential Distribution
5. Robust Inference under the Gamma Distribution
6. Robust Inference under the Weibull Distribution
7. Robust Inference under the Lognormal distribution
8. Robust Inference under the Proportional Hazards Model
9. Inference for One-Shot Devices with Multiple Failure Modes
10. Robust Inference under the Exponential Distribution and Competing Risks
11. Robust Inference under the Weibull Distribution and Competing Risks
12. Robust Inference under Cyclic Accelerated Life Tests
13. Summary and Future Directions
Appendix A Derivation of the Influence Function of the Weighted Minimum DPD Estimators
Este título pertence ao(s) assunto(s) indicados(s). Para ver outros títulos clique no assunto desejado.
Accelerated life tests; Bayesian inference; Competing risks; Confidence intervals; Exponential distribution; Influence function; Likelihood inference; Lognormal distribution; Minimum DPD estimators; Model misspecification; Non-parametric inference; One-shot devices; Proportional hazards; Reliability; Robustness; Semi-parametric model; Survival analysis; Wald test; Wald-type tests; Weibull distribution;
