Machine Learning Support for Fault Diagnosis of System-on-Chip
portes grátis
Machine Learning Support for Fault Diagnosis of System-on-Chip
Girard, Patrick; Blanton, Shawn; Wang, Li-C.
Springer International Publishing AG
03/2023
316
Dura
Inglês
9783031196386
15 a 20 dias
Descrição não disponível.
Introduction.- Prerequisites on Fault Diagnosis.- Conventional Methods for Fault Diagnosis.- Machine Learning and Its Applications in Test.- Machine Learning Support for Logic Diagnosis.- Machine Learning Support for Cell-Aware Diagnosis.- Machine Learning Support for Volume Diagnosis.- Machine Learning Support for Diagnosis of Analog Circuits.- Machine Learning Support for Board-level Functional Fault Diagnosis.- Machine Learning Support for Wafer-level Failure Cluster Identification.- Conclusion.
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Machine Learning in Design and Test;VLSI Design for Machine Learning;Smart Analytics for semiconductor design and test;Intelligent VLSI Test Engineering;Intelligent Yield Optimization
Introduction.- Prerequisites on Fault Diagnosis.- Conventional Methods for Fault Diagnosis.- Machine Learning and Its Applications in Test.- Machine Learning Support for Logic Diagnosis.- Machine Learning Support for Cell-Aware Diagnosis.- Machine Learning Support for Volume Diagnosis.- Machine Learning Support for Diagnosis of Analog Circuits.- Machine Learning Support for Board-level Functional Fault Diagnosis.- Machine Learning Support for Wafer-level Failure Cluster Identification.- Conclusion.
Este título pertence ao(s) assunto(s) indicados(s). Para ver outros títulos clique no assunto desejado.
