Lifetime Reliability-aware Design of Integrated Circuits
portes grátis
Lifetime Reliability-aware Design of Integrated Circuits
Ghavami, Behnam; Raji, Mohsen
Springer International Publishing AG
11/2022
107
Dura
Inglês
9783031153440
15 a 20 dias
360
Descrição não disponível.
1. Impacts of Process Variations and Aging on Lifetime Reliability of Flip-Flops.- 2 Restructuring-based Lifetime Reliability Improvement of Nano-scale Master-Slave Flip-Flops.- 3 Lifetime Reliability Improvement of Pulsed Flip-Flops.- 4 Gate Sizing-based Lifetime Reliability Improvement of Integrated Circuits.- 5 Joint Timing Yield and Lifetime Reliability Optimization of Integrated Circuits.- 6 Lifetime Reliability Optimization Algorithms of Integrated Circuits using Dual Threshold Voltage Assignment.
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reliability of digital systems;reliability of nano-scale CMOS digital circuits;Reliability Analysis of Flip-Flops;Reliability of Nanometer VLSI Systems;Ageing of Integrated Circuits
1. Impacts of Process Variations and Aging on Lifetime Reliability of Flip-Flops.- 2 Restructuring-based Lifetime Reliability Improvement of Nano-scale Master-Slave Flip-Flops.- 3 Lifetime Reliability Improvement of Pulsed Flip-Flops.- 4 Gate Sizing-based Lifetime Reliability Improvement of Integrated Circuits.- 5 Joint Timing Yield and Lifetime Reliability Optimization of Integrated Circuits.- 6 Lifetime Reliability Optimization Algorithms of Integrated Circuits using Dual Threshold Voltage Assignment.
Este título pertence ao(s) assunto(s) indicados(s). Para ver outros títulos clique no assunto desejado.
