Industrial Artificial Intelligence Technologies and Applications
portes grátis
Industrial Artificial Intelligence Technologies and Applications
Nava, Mario Diaz; Wotawa, Franz; Vermesan, Ovidiu; Debaillie, Bjoern
River Publishers
09/2023
211
Dura
Inglês
9788770227919
15 a 20 dias
Descrição não disponível.
1. Benchmarking Neuromorphic Computing for Inference 2. Benchmarking the Epiphany Processor as a Reference Neuromorphic Architecture 3. Temporal Delta Layer: Exploiting Temporal Sparsity in Deep Neural Networks for Time-Series Data 4. An End-to-End AI-based Automated Process for Semiconductor Device Parameter Extraction 5. AI Machine Vision System for Wafer Defect Detection 6. Failure Detection in Silicon Package 7. S2ORC-SemiCause: Annotating and Analysing Causality in the Semiconductor Domain 8. Feasibility of Wafer Exchange for European Edge AI Pilot Lines 9. A Framework for Integrating Automated Diagnosis into Simulation 10. Deploying a Convolutional Neural Network on Edge MCU and Neuromorphic Hardware Platforms 11. Efficient Edge Deployment Demonstrated on YOLOv5 and Coral Edge TPU 12. Embedded Edge Intelligent Processing for End-To-End Predictive Maintenance in Industrial Applications 13. AI-Driven Strategies to Implement a Grapevine Downy Mildew Warning System 14. On the Verification of Diagnosis Models
Este título pertence ao(s) assunto(s) indicados(s). Para ver outros títulos clique no assunto desejado.
neuromorphic computing;embedded machine learning;predictive maintenance;wireless industrial networks;semiconductor defect detection;edge hardware deployment;trustworthy AI systems for manufacturing
1. Benchmarking Neuromorphic Computing for Inference 2. Benchmarking the Epiphany Processor as a Reference Neuromorphic Architecture 3. Temporal Delta Layer: Exploiting Temporal Sparsity in Deep Neural Networks for Time-Series Data 4. An End-to-End AI-based Automated Process for Semiconductor Device Parameter Extraction 5. AI Machine Vision System for Wafer Defect Detection 6. Failure Detection in Silicon Package 7. S2ORC-SemiCause: Annotating and Analysing Causality in the Semiconductor Domain 8. Feasibility of Wafer Exchange for European Edge AI Pilot Lines 9. A Framework for Integrating Automated Diagnosis into Simulation 10. Deploying a Convolutional Neural Network on Edge MCU and Neuromorphic Hardware Platforms 11. Efficient Edge Deployment Demonstrated on YOLOv5 and Coral Edge TPU 12. Embedded Edge Intelligent Processing for End-To-End Predictive Maintenance in Industrial Applications 13. AI-Driven Strategies to Implement a Grapevine Downy Mildew Warning System 14. On the Verification of Diagnosis Models
Este título pertence ao(s) assunto(s) indicados(s). Para ver outros títulos clique no assunto desejado.
