Cu-Interconnects, Glass, and AI-Assisted Simulation for Chiplets and Heterogeneous Integration

Cu-Interconnects, Glass, and AI-Assisted Simulation for Chiplets and Heterogeneous Integration portes grátis

Cu-Interconnects, Glass, and AI-Assisted Simulation for Chiplets and Heterogeneous Integration

Chiang, Kuo-Ning; Lau, John

Springer Verlag, Singapore

04/2026

320

Dura

Inglês

9789819568901

Pré-lançamento - envio 15 a 20 dias após a sua edição

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Advanced Packaging.- Cu Hybrid Bonding.- Glass Packaging.- CoPackaged Optics (CPO).- Characterization of Low Loss Dielectric Materials for Speed and Frequency Applications.- Fatigue and Fracture Models for Electronic Packaging.- AI and Machine Learning Algorithms.- Modeling and Design Simulation Technology.- Integrating AI with Design Simulation for Advanced Packaging.
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Cu-interconnects;Glass-core substrate ;Photonic IC and Electronic IC;Fatigue-Fracture;AI-assisted simulations;Reliability