Advanced Materials Characterization
portes grátis
Advanced Materials Characterization
Basic Principles, Novel Applications, and Future Directions
Kumar, Ch Sateesh; Singh, M. Muralidhar; Krishna, Ram
Taylor & Francis Ltd
05/2023
130
Dura
Inglês
9781032375106
15 a 20 dias
Descrição não disponível.
1.Introduction to material characterization 2. X-Ray Diffraction (XRD) 3. Nanomechanical system 4. X-Ray photo spectroscopy (XPS) 5. Scanning electron microscope (SEM) 6. Field emission scanning electron microscope (FESEM) 7. Transmission electron microscope (TEM) 8. Atomic Force Microscope (AFM) 9. Near-field scanning optical microscope Raman 10. Optical characterization instruments 11. Synchrotron techniques 12. Other advanced instruments used for characterization of functionally graded materials
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materials microstructure analysis;nanomaterials research methods;electron microscopy techniques;surface property evaluation;thermal analysis instrumentation;polymer composites characterization;advanced materials microscopy applications
1.Introduction to material characterization 2. X-Ray Diffraction (XRD) 3. Nanomechanical system 4. X-Ray photo spectroscopy (XPS) 5. Scanning electron microscope (SEM) 6. Field emission scanning electron microscope (FESEM) 7. Transmission electron microscope (TEM) 8. Atomic Force Microscope (AFM) 9. Near-field scanning optical microscope Raman 10. Optical characterization instruments 11. Synchrotron techniques 12. Other advanced instruments used for characterization of functionally graded materials
Este título pertence ao(s) assunto(s) indicados(s). Para ver outros títulos clique no assunto desejado.
