Silicon, Germanium, and Their Alloys
portes grátis
Silicon, Germanium, and Their Alloys
Growth, Defects, Impurities, and Nanocrystals
Kissinger, Gudrun; Pizzini, Sergio
Taylor & Francis Ltd
03/2021
431
Mole
Inglês
9780367783655
15 a 20 dias
798
Descrição não disponível.
Modern Aspects of Czochralski and Multicrystalline Silicon Crystal Growth. Growth and Characterization of Silicon-Germanium Alloys. Germanium on Silicon: Epitaxy and Applications. Self-Interstitials in Silicon and Germanium. Vacancies in Si and Ge. Self- and Dopant Diffusion in Silicon, Germanium, and Their Alloys. Hydrogen in Si and Ge. Point Defect Complexes in Silicon. Defect Delineation in Silicon Materials by Chemical Etching Techniques. Investigation of Defects and Impurities in Silicon by Infrared and Photoluminescence Spectroscopies. Device Operation as Crystal Quality Probe. Silicon and Germanium Nanocrystals.
Este título pertence ao(s) assunto(s) indicados(s). Para ver outros títulos clique no assunto desejado.
Oxygen Precipitates;SiGe Alloys;Point Defect;CZ Silicon;DLTS Spectrum;X-ray Topographic Image;Point Defect Complexes;Intrinsic Point Defects;AB INITIO;Migration Enthalpy;Seebeck Coefcient;MeV Electron Irradiation;Ge Atoms;Ge QDs;Si NCs;Etch Rate;Dopant Diffusion;Si Fraction;Etch Pits;Native Point Defects;Etching Solutions;Activation Enthalpy;Preferential Etching;Melt Convection;H2 Molecule
Modern Aspects of Czochralski and Multicrystalline Silicon Crystal Growth. Growth and Characterization of Silicon-Germanium Alloys. Germanium on Silicon: Epitaxy and Applications. Self-Interstitials in Silicon and Germanium. Vacancies in Si and Ge. Self- and Dopant Diffusion in Silicon, Germanium, and Their Alloys. Hydrogen in Si and Ge. Point Defect Complexes in Silicon. Defect Delineation in Silicon Materials by Chemical Etching Techniques. Investigation of Defects and Impurities in Silicon by Infrared and Photoluminescence Spectroscopies. Device Operation as Crystal Quality Probe. Silicon and Germanium Nanocrystals.
Este título pertence ao(s) assunto(s) indicados(s). Para ver outros títulos clique no assunto desejado.
Oxygen Precipitates;SiGe Alloys;Point Defect;CZ Silicon;DLTS Spectrum;X-ray Topographic Image;Point Defect Complexes;Intrinsic Point Defects;AB INITIO;Migration Enthalpy;Seebeck Coefcient;MeV Electron Irradiation;Ge Atoms;Ge QDs;Si NCs;Etch Rate;Dopant Diffusion;Si Fraction;Etch Pits;Native Point Defects;Etching Solutions;Activation Enthalpy;Preferential Etching;Melt Convection;H2 Molecule
