Scanning Probe Microscopy

Scanning Probe Microscopy

The Lab on a Tip

Bennewitz, Roland; Meyer, Ernst; Hug, Hans J.

Springer Nature Switzerland AG

06/2022

322

Mole

Inglês

9783030370916

15 a 20 dias

516

Descrição não disponível.
Introduction to Scanning Probe Microscopy.- Overview.- Basic Concepts.- Introduction to Scanning Tunneling Microscopy.- Tunneling: A Quantum-Mechanical Effect.- Instrumental Aspects.- Resolution Limits.- Observation of Confined Electrons.- Spin-Polarized Tunneling.- Observation of the Kondo Effect and Quantum Mirage.- Force Microscopy.- Concept and Instrumental Aspects.- Relevant Forces.- Operation Modes in Force Microscopy.- Contact Force Microscopy.- Dynamic Force Microscopy.- Tapping Mode Force Microscopy.- Further Modes of Force Microscopy.- Force Resolution and Thermal Noise.- High-speed AFM.- Multifrequency AFM.- MFM and Related Techniques.- MFM Operation Modes.- Contrast Formation.- Magnetic Resonance Force Microscopy.- Other Members of the SPM Family.- Artifacts in SPM.- Future Aspects of SPM.
Scanning Tunneling Microscopy;Atomic Force Microscopy;Magnetic Force Microscopy;Friction Force Microscopy;Introduction to STM techniques;Contact Force Microscopy;Tapping Mode Force Microscopy;High-speed imaging of biological matter