Scanning Probe Microscopy

Introduction to Scanning Probe Microscopy.- Overview.- Basic Concepts.- Introduction to Scanning Tunneling Microscopy.- Tunneling: A Quantum-Mechanical Effect.- Instrumental Aspects.- Resolution Limits.- Observation of Confined Electrons.- Spin-Polarized Tunneling.- Observation of the Kondo Effect and Quantum Mirage.- Force Microscopy.- Concept and Instrumental Aspects.- Relevant Forces.- Operation Modes in Force Microscopy.- Contact Force Microscopy.- Dynamic Force Microscopy.- Tapping Mode Force Microscopy.- Further Modes of Force Microscopy.- Force Resolution and Thermal Noise.- High-speed AFM.- Multifrequency AFM.- MFM and Related Techniques.- MFM Operation Modes.- Contrast Formation.- Magnetic Resonance Force Microscopy.- Other Members of the SPM Family.- Artifacts in SPM.- Future Aspects of SPM.

Este título pertence ao(s) assunto(s) indicados(s). Para ver outros títulos clique no assunto desejado.

• Ensaio de materiais
• Física da Matéria Condensada (física do estado sólido e estado líquido)
• Análise de espectro, spectrochemistry, espectrometria de massa
• Ciência dos materiais
• Mensuração e sistemas de medição

Scanning Tunneling Microscopy;Atomic Force Microscopy;Magnetic Force Microscopy;Friction Force Microscopy;Introduction to STM techniques;Contact Force Microscopy;Tapping Mode Force Microscopy;High-speed imaging of biological matter