RF and Time-domain Techniques for Evaluating Novel Semiconductor Transistors
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RF and Time-domain Techniques for Evaluating Novel Semiconductor Transistors
Jenkins, Keith A.
Springer Nature Switzerland AG
12/2022
168
Mole
Inglês
9783030777777
15 a 20 dias
285
Descrição não disponível.
Introduction.- Signal propagation & connection to devices.- Frequency characterization of devices.- Spectral analysis techniques.- Device propagation delay.- Jitter measurement.- Transient and time-dependent phenomena.
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Characterization of novel transistors;electrical performance of novel devices;Frequency characterization of novel devices;Transient and time-dependent phenomena in novel devices;Expected frequency response of FET and BJT transistors
Introduction.- Signal propagation & connection to devices.- Frequency characterization of devices.- Spectral analysis techniques.- Device propagation delay.- Jitter measurement.- Transient and time-dependent phenomena.
Este título pertence ao(s) assunto(s) indicados(s). Para ver outros títulos clique no assunto desejado.
