Advanced Computing in Electron Microscopy
portes grátis
Advanced Computing in Electron Microscopy
Kirkland, Earl J.
Springer Nature Switzerland AG
03/2020
354
Dura
Inglês
9783030332594
15 a 20 dias
717
Descrição não disponível.
Introduction.- The Transmission Electron Microscope.- Some Image Approximations.- Sampling and the Fast Fourier Transform.- Calculation of Images of Thin Specimens.- Theory of Calculation of Images of Thick Specimens.- Multislice Applications and Examples.- The Programss.- App. A: Plotting Transfer Functions.- App. B: The Fourier Projection Theorem.- App. C: Atomic Potentials and Scattering Factors.- App. D: The Inverse Problem.- App. E: Bilinear Interpolation.- App. F: 3D Perspective View.
Este título pertence ao(s) assunto(s) indicados(s). Para ver outros títulos clique no assunto desejado.
fast fourier projection theorem;fast fourier transform;multislice methods;scanning transmission electron microscope;theory of electron image formation;transmission electron microscopy;image interpretation;parallel image processing;ABF imaging;Biological Microscopy
Introduction.- The Transmission Electron Microscope.- Some Image Approximations.- Sampling and the Fast Fourier Transform.- Calculation of Images of Thin Specimens.- Theory of Calculation of Images of Thick Specimens.- Multislice Applications and Examples.- The Programss.- App. A: Plotting Transfer Functions.- App. B: The Fourier Projection Theorem.- App. C: Atomic Potentials and Scattering Factors.- App. D: The Inverse Problem.- App. E: Bilinear Interpolation.- App. F: 3D Perspective View.
Este título pertence ao(s) assunto(s) indicados(s). Para ver outros títulos clique no assunto desejado.
